000			02099cam a22003857a 4500
001			16385080
003			OSt
005			20250615122235.0
008			100810s2009 paua b 101 0 eng d
010			_a 2010487191
020			_a9781605111575 (hbk.)
020			_a1605111570 (hbk.)
035			_a(OCoLC)ocn460562390
040			_aLHL _cLHL _dRRR _dCUS _dDLC
042			_alccopycat
050	0	0	_aQD906.7.E37 S96 2009 _bS96 2009
111	2		_aSymposium GG, "Electron Crystallography for Materials Research" _d(2009 : _cSan Francisco, Calif.)
245	1	0	_aElectron crystallography for materials research and quantitative characterization of nanostructured materials : _bsymposia held April 14-16, 2009, San Francisco, California, USA / _ceditors, Peter Moeck .. [et al.] ; Symposium GG organizers, Peter Moeck ... [et al.] ; Symposium HH organizers, Frank (Bud) Bridges ... [et al.].
260			_aWarrendale, Pa. : _bMaterials Research Society, _cc2009.
300			_aviii, 211 p. : _bill. ; _c24 cm.
490	1		_aMaterials Research Society symposium proceedings ; _vv. 1184
500			_a"Symposium GG, 'Electron Crystallography for Materials Research,' held April 13-14 at the 2009 MRS Spring Meeting in San Francisco, California"--P. [ix].
500			_a"Symposium HH, 'Quantitative Characterization of Nanostructured Materials,' held April 14-16 at the 2009 MRS Spring Meeting in San Francisco, California"-- P. [xi].
504			_aIncludes bibliographical references and indexes.
650		0	_aCrystallography _vCongresses.
650		0	_aElectron microscopy _vCongresses.
650		0	_aNanocrystals _vCongresses.
700	1		_aMoeck, Peter.
700	1		_aBridges, Frank George Baskerville, _d1940-
711	2		_aSymposium HH, "Quantitative Characterization of Nanostructured Materials" _d(2009 : _cSan Francisco, Calif.)
830		0	_aMaterials Research Society symposia proceedings ; _vv. 1184.
906			_a7 _bcbc _ccopycat _d2 _encip _f20 _gy-gencatlg
942			_2lcc _cBK _n0
999			_c1458 _d1458